Advances in metrology for X-ray and EUV optics II : 30 August 2007, San Diego, California, USA

http://www.w3.org/1999/02/22-rdf-syntax-ns#type

http://schema.org/CreativeWork
http://schema.org/Book

http://schema.org/about

http://id.worldcat.org/fast/1046734
http://id.loc.gov/authorities/subjects/sh2009128872
http://id.loc.gov/authorities/subjects/sh2008108676
http://id.worldcat.org/fast/992810
http://experiment.worldcat.org/entity/work/data/496006930#Topic/interferometres_a_laser_congres
http://id.worldcat.org/fast/1715944
http://experiment.worldcat.org/entity/work/data/496006930#Topic/mesures_optiques_congres
http://id.loc.gov/authorities/subjects/sh85095150
http://id.loc.gov/authorities/subjects/sh2008108674
http://id.loc.gov/authorities/subjects/sh85074778
http://id.worldcat.org/fast/1046776
http://id.loc.gov/authorities/subjects/sh85095156
http://experiment.worldcat.org/entity/work/data/496006930#Topic/optique_instruments_conception_et_construction_congres
http://id.loc.gov/authorities/subjects/sh2008107149
http://id.worldcat.org/fast/1013181
http://id.loc.gov/authorities/subjects/sh85082706
http://id.worldcat.org/fast/1013187
http://id.worldcat.org/fast/1046741
http://experiment.worldcat.org/entity/work/data/496006930#Topic/mesure_instruments_conception_et_construction_congres
http://id.loc.gov/authorities/subjects/sh85083608
http://id.loc.gov/authorities/subjects/sh85095151
http://experiment.worldcat.org/entity/work/data/496006930#Topic/mesure_congres

http://schema.org/contributor

http://worldcat.org/entity/person/id/2634836981
http://viaf.org/viaf/167606997
http://worldcat.org/entity/person/id/2630983217
http://experiment.worldcat.org/entity/work/data/496006930#Organization/society_of_photo_optical_instrumentation_engineers
http://worldcat.org/entity/person/id/2631165884
http://experiment.worldcat.org/entity/work/data/496006930#Meeting/conference_2007_08_30_san_diego_calif
http://experiment.worldcat.org/entity/work/data/496006930#Organization/society_of_photo_optical_instrumentation_engineers_united_states

http://schema.org/creator

http://experiment.worldcat.org/entity/work/data/496006930#Meeting/advances_in_metrology_for_x_ray_and_euv_optics_2_2007

http://schema.org/genre

"Conference papers and proceedings"
"Conference papers and proceedings"@en

http://schema.org/name

"Advances in metrology for X-ray and EUV optics II : 30 August 2007, San Diego, California, USA"@en
"Advances in metrology for X-ray and EUV optics II : 30 August 2007, San Diego, California, USA"
"Advances in metrology for x-ray and EUV optics II : 30 August 2007, San Diego, California, USA"
"Advances in metrology for x-ray and EUV optics II 30 August 2007, San Diego, California, USA"
"Advances in metrology for x-ray and EUV optics II 30 August 2007, San Diego, California, USA"@en

http://schema.org/workExample

http://www.worldcat.org/oclc/799711807
http://www.worldcat.org/oclc/182860020
http://www.worldcat.org/oclc/840401141
http://www.worldcat.org/oclc/839642516
http://www.worldcat.org/oclc/850109716
http://www.worldcat.org/oclc/254582753
http://www.worldcat.org/oclc/468144247
http://www.worldcat.org/oclc/174030459
http://www.worldcat.org/oclc/759722986

Advances in metrology for X-ray and EUV optics (2 ; 2007).

This is a placeholder reference for a Meeting entity, related to a WorldCat Entity. Over time, these references will be replaced with persistent URIs to VIAF, FAST, WorldCat, and other Linked Data resources.

rdf:type
http://schema.org/Event
http://www.productontology.org/id/Meeting
schema:name
"Advances in metrology for X-ray and EUV optics (2 ; 2007)."

http://experiment.worldcat.org/entity/work/data/496006930#Meeting/advances_in_metrology_for_x_ray_and_euv_optics_2_2007

Conference (2007.08.30 San Diego, Calif.)

rdf:type
http://schema.org/Event
http://www.productontology.org/id/Meeting
schema:name
"Conference (2007.08.30 San Diego, Calif.)"

http://experiment.worldcat.org/entity/work/data/496006930#Meeting/conference_2007_08_30_san_diego_calif

Society of Photo-Optical Instrumentation Engineers.

This is a placeholder reference for a Organization entity, related to a WorldCat Entity. Over time, these references will be replaced with persistent URIs to VIAF, FAST, WorldCat, and other Linked Data resources.

rdf:type
http://schema.org/Organization
schema:name
"Society of Photo-Optical Instrumentation Engineers."
"Society of Photo-optical Instrumentation Engineers."
"Society of Photo-optical Instrumentation Engineers"

http://experiment.worldcat.org/entity/work/data/496006930#Organization/society_of_photo_optical_instrumentation_engineers

Society of Photo-optical Instrumentation Engineers (United States)

rdf:type
http://schema.org/Organization
schema:name
"Society of Photo-optical Instrumentation Engineers (United States)"

http://experiment.worldcat.org/entity/work/data/496006930#Organization/society_of_photo_optical_instrumentation_engineers_united_states

Interféromètres à laser Congrès.

This is a placeholder reference for a Topic entity, related to a WorldCat Entity. Over time, these references will be replaced with persistent URIs to VIAF, FAST, WorldCat, and other Linked Data resources.

rdf:type
http://schema.org/Topic
schema:name
"Interféromètres à laser Congrès."

http://experiment.worldcat.org/entity/work/data/496006930#Topic/interferometres_a_laser_congres

Mesure Congrès.

rdf:type
http://schema.org/Topic
schema:name
"Mesure Congrès."

http://experiment.worldcat.org/entity/work/data/496006930#Topic/mesure_congres

Mesure Instruments Conception et construction Congrès.

rdf:type
http://schema.org/Topic
schema:name
"Mesure Instruments Conception et construction Congrès."

http://experiment.worldcat.org/entity/work/data/496006930#Topic/mesure_instruments_conception_et_construction_congres

Mesures optiques Congrès.

rdf:type
http://schema.org/Topic
schema:name
"Mesures optiques Congrès."

http://experiment.worldcat.org/entity/work/data/496006930#Topic/mesures_optiques_congres

Optique Instruments Conception et construction Congrès.

rdf:type
http://schema.org/Topic
schema:name
"Optique Instruments Conception et construction Congrès."