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http://worldcat.org/entity/work/id/499270394

Physical aspects of electron microscopy and microbeam analysis

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  • "Transmission electron microscopy; Resolution and contrast; Physical applications (Materials and metallurgical applications) using high voltage, conventional, and scanning microscopy; Biophysical: radiation damage; Energy analysis; Instrumentation: field emission illuminaling Systems."

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  • "Physical aspects of electron microscopy and microbeam analysis : [meeting held in New Orleans, Aug. 14-17, 1973], jointly sponsored by the Elctron Microscopy Society of America and the Microbeam Analysis Society"
  • "Physical aspects of electron microscopy and microbeam analysis, ed by Benjamin M. Siegel, Donald R. Beaman"
  • "Physical aspects of electron microscopy and microbeam analysis : a meeting held in New Orleans, August 14-17, 1973"
  • "Physical aspects of electron microscopy and microbeam analysis : [annual meeting jointly held by the Electron Microscopy Society of America and the Microbeam Analysis Society in New Orleans on August 14-17, 1973]"
  • "Physical aspects of electron microscopy and microbean analysis"
  • "Physical aspects of electron microscopy and microbeam analysis"
  • "Physical aspects of electron microscopy and microbeam analysis"@en

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