<http://experiment.worldcat.org/entity/work/data/60672850#Topic/boundary_scan> <http://schema.org/name> "boundary scan." .
<http://experiment.worldcat.org/entity/work/data/60672850#Topic/boundary_scan> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/60672850#Topic/test_systeme> <http://schema.org/name> "test système." .
<http://experiment.worldcat.org/entity/work/data/60672850#Topic/test_systeme> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/60672850#Topic/cao> <http://schema.org/name> "CAO." .
<http://experiment.worldcat.org/entity/work/data/60672850#Topic/cao> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/60672850#Topic/test_logiciel> <http://schema.org/name> "test logiciel." .
<http://experiment.worldcat.org/entity/work/data/60672850#Topic/test_logiciel> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/60672850#Topic/circuits_integres_congres> <http://schema.org/name> "Circuits intégrés Congrès." .
<http://experiment.worldcat.org/entity/work/data/60672850#Topic/circuits_integres_congres> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/60672850#Topic/generation_test> <http://schema.org/name> "génération test." .
<http://experiment.worldcat.org/entity/work/data/60672850#Topic/generation_test> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/60672850#Meeting/international_test_conference_itc_23_1992_09_baltimore_md> <http://schema.org/name> "International Test Conference (ITC) (23 1992.09. Baltimore, Md.)" .
<http://experiment.worldcat.org/entity/work/data/60672850#Meeting/international_test_conference_itc_23_1992_09_baltimore_md> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://www.productontology.org/id/Meeting> .
<http://experiment.worldcat.org/entity/work/data/60672850#Meeting/international_test_conference_itc_23_1992_09_baltimore_md> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Event> .
<http://experiment.worldcat.org/entity/work/data/60672850#Meeting/international_test_conference_1992_baltimore_md> <http://schema.org/name> "International Test Conference (1992 : Baltimore, Md.)" .
<http://experiment.worldcat.org/entity/work/data/60672850#Meeting/international_test_conference_1992_baltimore_md> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://www.productontology.org/id/Meeting> .
<http://experiment.worldcat.org/entity/work/data/60672850#Meeting/international_test_conference_1992_baltimore_md> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Event> .
<http://experiment.worldcat.org/entity/work/data/60672850#Topic/test_circuit> <http://schema.org/name> "test circuit." .
<http://experiment.worldcat.org/entity/work/data/60672850#Topic/test_circuit> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/60672850#Topic/generation_test> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh2008104739> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/contributor> <http://viaf.org/viaf/145122972> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/60672850#Topic/test_memoire> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh2008123902> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/60672850#Topic/test_signal> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/60672850#Topic/architecture_test> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh85084898> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/creator> <http://experiment.worldcat.org/entity/work/data/60672850#Meeting/international_test_conference_23rd_1992_baltimore_md> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/workExample> <http://www.worldcat.org/oclc/635251408> .
<http://worldcat.org/entity/work/id/60672850> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/CreativeWork> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/about> <http://id.worldcat.org/fast/872601> .
<http://worldcat.org/entity/work/id/60672850> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Book> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/contributor> <http://viaf.org/viaf/123926298> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/about> <http://id.worldcat.org/fast/907175> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/creator> <http://experiment.worldcat.org/entity/work/data/60672850#Meeting/international_test_conference_1992_baltimore_md> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/contributor> <http://viaf.org/viaf/122710723> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/60672850#Topic/testabilite> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/workExample> <http://www.worldcat.org/oclc/720452293> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/60672850#Topic/circuits_integres_congres> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/60672850#Topic/test_logiciel> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/name> "Proceedings / International Test Conference. 1992" .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/name> "Proceedings"@en .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/creator> <http://viaf.org/viaf/132542004> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/creator> <http://viaf.org/viaf/178976419> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/contributor> <http://experiment.worldcat.org/entity/work/data/60672850#Meeting/international_test_conference_itc_23_1992_09_baltimore_md> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh2009121253> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/creator> <http://id.loc.gov/authorities/names/n82036743> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/contributor> <http://id.loc.gov/authorities/names/n79043202> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/name> "International Test Conference, 1992 proceedings"@en .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/alternateName> "1992 IEEE International Test Conference"@en .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/name> "International Test Conference, 1992 : proceedings"@en .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/60672850#Topic/cao> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh2007101732> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/workExample> <http://www.worldcat.org/oclc/27010319> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/60672850#Topic/test_circuit> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/60672850#Topic/cmos> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/name> "Proceedings : September 20 - 24, 1992, Convention Center, Baltimore, MD, USA" .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/genre> "Conference papers and proceedings"@en .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/alternateName> "IEEE International Test Conference"@en .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/about> <http://id.worldcat.org/fast/975593> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/workExample> <http://www.worldcat.org/oclc/74344995> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/about> <http://id.worldcat.org/fast/1020032> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/workExample> <http://www.worldcat.org/oclc/831440604> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/60672850#Topic/test_systeme> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh88000495> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/60672850#Topic/boundary_scan> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh85042314> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/alternateName> "Discover the new world of test and design" .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/60672850#Topic/bist> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/about> <http://id.worldcat.org/fast/1432130> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/60672850#Topic/test_microprocesseur> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/60672850#Topic/modelisation_panne> .
<http://worldcat.org/entity/work/id/60672850> <http://schema.org/contributor> <http://id.loc.gov/authorities/names/n79053217> .
<http://experiment.worldcat.org/entity/work/data/60672850#Topic/testabilite> <http://schema.org/name> "testabilité" .
<http://experiment.worldcat.org/entity/work/data/60672850#Topic/testabilite> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/60672850#Topic/bist> <http://schema.org/name> "BIST." .
<http://experiment.worldcat.org/entity/work/data/60672850#Topic/bist> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/60672850#Topic/modelisation_panne> <http://schema.org/name> "modélisation panne." .
<http://experiment.worldcat.org/entity/work/data/60672850#Topic/modelisation_panne> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/60672850#Topic/test_signal> <http://schema.org/name> "test signal." .
<http://experiment.worldcat.org/entity/work/data/60672850#Topic/test_signal> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/60672850#Topic/test_microprocesseur> <http://schema.org/name> "test microprocesseur." .
<http://experiment.worldcat.org/entity/work/data/60672850#Topic/test_microprocesseur> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/60672850#Meeting/international_test_conference_23rd_1992_baltimore_md> <http://schema.org/name> "International Test Conference (23rd : 1992 : Baltimore, Md.)" .
<http://experiment.worldcat.org/entity/work/data/60672850#Meeting/international_test_conference_23rd_1992_baltimore_md> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://www.productontology.org/id/Meeting> .
<http://experiment.worldcat.org/entity/work/data/60672850#Meeting/international_test_conference_23rd_1992_baltimore_md> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Event> .
<http://experiment.worldcat.org/entity/work/data/60672850.nt> <http://rdfs.org/ns/void#inDataset> <http://purl.oclc.org/dataset/WorldCat/Works> .
<http://experiment.worldcat.org/entity/work/data/60672850.nt> <http://schema.org/about> <http://worldcat.org/entity/work/id/60672850> .
<http://experiment.worldcat.org/entity/work/data/60672850#Topic/test_memoire> <http://schema.org/name> "test mémoire." .
<http://experiment.worldcat.org/entity/work/data/60672850#Topic/test_memoire> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/60672850#Topic/architecture_test> <http://schema.org/name> "architecture test." .
<http://experiment.worldcat.org/entity/work/data/60672850#Topic/architecture_test> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/60672850#Topic/cmos> <http://schema.org/name> "CMOS." .
<http://experiment.worldcat.org/entity/work/data/60672850#Topic/cmos> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .