<http://experiment.worldcat.org/entity/work/data/7103388#Topic/conception_puce> <http://schema.org/name> "conception puce." .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/conception_puce> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/compilation_silicium> <http://schema.org/name> "compilation silicium." .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/compilation_silicium> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/cao> <http://schema.org/name> "CAO." .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/cao> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/conception_vlsi> <http://schema.org/name> "conception VLSI." .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/conception_vlsi> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/verification_logique> <http://schema.org/name> "vérification logique." .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/verification_logique> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/simulation_panne> <http://schema.org/name> "simulation panne." .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/simulation_panne> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/circuit_integre> <http://schema.org/name> "circuit intégré" .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/circuit_integre> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/vlsi> <http://schema.org/name> "VLSI." .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/vlsi> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/facteur_humain> <http://schema.org/name> "facteur humain." .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/facteur_humain> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/test_vlsi> <http://schema.org/name> "test VLSI." .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/test_vlsi> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/systeme_expert> <http://schema.org/name> "système expert." .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/systeme_expert> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/testabilite> <http://schema.org/name> "testabilité" .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/testabilite> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/conception_pla> <http://schema.org/name> "conception PLA." .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/conception_pla> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/7103388.nt> <http://rdfs.org/ns/void#inDataset> <http://purl.oclc.org/dataset/WorldCat/Works> .
<http://experiment.worldcat.org/entity/work/data/7103388.nt> <http://schema.org/about> <http://worldcat.org/entity/work/id/7103388> .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/optimisation_performance> <http://schema.org/name> "optimisation performance." .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/optimisation_performance> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/genie_logiciel> <http://schema.org/name> "génie logiciel." .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/genie_logiciel> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/7103388#Meeting/acm_ieee_design_automation_conference_24th_1987_miami_beach_fla> <http://schema.org/name> "ACM IEEE Design Automation Conference (24th : 1987 : Miami Beach, Fla.)" .
<http://experiment.worldcat.org/entity/work/data/7103388#Meeting/acm_ieee_design_automation_conference_24th_1987_miami_beach_fla> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://www.productontology.org/id/Meeting> .
<http://experiment.worldcat.org/entity/work/data/7103388#Meeting/acm_ieee_design_automation_conference_24th_1987_miami_beach_fla> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Event> .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/base_donnee> <http://schema.org/name> "base donnée." .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/base_donnee> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/accelerateur_materiel> <http://schema.org/name> "accélérateur matériel." .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/accelerateur_materiel> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/7103388#Topic/simulation_panne> .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/name> "Proceedings 1987 : 24th ACM/IEEE Design Automation Conference ; 24th ACM/IEEE DAC, Miami Beach, Fla"@en .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/7103388#Topic/accelerateur_materiel> .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/workExample> <http://www.worldcat.org/oclc/51304552> .
<http://worldcat.org/entity/work/id/7103388> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/CreativeWork> .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/contributor> <http://id.loc.gov/authorities/names/n85271173> .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/alternateName> "DAC '87"@en .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/alternateName> "1987 Design Automation Conference"@en .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/7103388#Topic/compilation_silicium> .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/7103388#Topic/testabilite> .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/7103388#Topic/systeme_expert> .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/contributor> <http://viaf.org/viaf/143598096> .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/contributor> <http://viaf.org/viaf/155091561> .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/7103388#Topic/test_vlsi> .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/7103388#Topic/genie_logiciel> .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/contributor> <http://id.loc.gov/authorities/names/no98128269> .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/7103388#Topic/vlsi> .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/creator> <http://experiment.worldcat.org/entity/work/data/7103388#Meeting/acm_ieee_design_automation_conference_24th_1987_miami_beach_fla> .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/7103388#Topic/conception_pla> .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/7103388#Topic/generation_test> .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/7103388#Topic/cao> .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/name> "Proceedings 1987 24th ACM/IEEE Design Automation Conference ; 24th ACM/IEEE DAC, Miami Beach, Fla"@en .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/7103388#Topic/base_donnee> .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/7103388#Topic/conception_vlsi> .
<http://worldcat.org/entity/work/id/7103388> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Book> .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/7103388#Topic/verification_logique> .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/7103388#Topic/circuit_integre> .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/about> <http://id.worldcat.org/fast/910460> .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/7103388#Topic/facteur_humain> .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/alternateName> "24th ACM/IEEE conference proceedings on Design Automation Conference"@en .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/workExample> <http://www.worldcat.org/oclc/16720897> .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/genre> "Conference papers and proceedings"@en .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/contributor> <http://id.loc.gov/authorities/names/n91109047> .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/contributor> <http://viaf.org/viaf/150168807> .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/7103388#Topic/conception_puce> .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh2008103073> .
<http://worldcat.org/entity/work/id/7103388> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/7103388#Topic/optimisation_performance> .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/generation_test> <http://schema.org/name> "génération test." .
<http://experiment.worldcat.org/entity/work/data/7103388#Topic/generation_test> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .