Linked Data Explorerhttp://worldcat.org/entity/work/id/7206066
Klassifikation von Mustern
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http://schema.org/about
- http://experiment.worldcat.org/entity/work/data/7206066#Topic/software_engineering
- http://experiment.worldcat.org/entity/work/data/7206066#Topic/mustererkennung
- http://experiment.worldcat.org/entity/work/data/7206066#Topic/image_processing_and_computer_vision
- http://experiment.worldcat.org/entity/work/data/7206066#Topic/klassifikation
- http://experiment.worldcat.org/entity/work/data/7206066#Topic/zeichen_kybernetik
- http://id.loc.gov/authorities/subjects/sh85098789
- http://experiment.worldcat.org/entity/work/data/7206066#Topic/computer_science
- http://experiment.worldcat.org/entity/work/data/7206066#Topic/erkennung
- http://id.worldcat.org/fast/1055257
- http://experiment.worldcat.org/entity/work/data/7206066#Topic/software_engineering_programming_and_operating_systems
- http://experiment.worldcat.org/entity/work/data/7206066#Topic/computer_vision
- http://id.loc.gov/authorities/subjects/sh85098791
- http://experiment.worldcat.org/entity/work/data/7206066#Topic/computer_hardware
- http://id.worldcat.org/fast/1055254
- http://id.worldcat.org/fast/1055266
http://schema.org/name
- "Klassifikation von Mustern"
- "Klassifikation von mustern"
http://schema.org/workExample
- http://www.worldcat.org/oclc/439652665
- http://www.worldcat.org/oclc/716075591
- http://www.worldcat.org/oclc/720904000
- http://www.worldcat.org/oclc/252253298
- http://www.worldcat.org/oclc/913775204
- http://www.worldcat.org/oclc/13422096
- http://www.worldcat.org/oclc/863972391
- http://www.worldcat.org/oclc/839411663