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http://worldcat.org/entity/work/id/795359276

Characterization and metrology for ULSI technology, 2000 : international conference, Gaithersburg, Maryland, 26-29 June 2000

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http://experiment.worldcat.org/entity/work/data/795359276#Meeting/international_conference_on_characterization_and_metrology_for_ulsi_technology_2000_gaithersburg_md

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"Software"@en
"Conference papers and proceedings"
"Conference papers and proceedings"@en
"Conference proceedings"@en

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"Characterization and metrology for ULSI technology, 2000 : international conference, Gaithersburg, Maryland, 26-29 June 2000"@en
"Characterization and Metrology for ULSI Technology : 2000, International Conference, Gaithersburg, Maryland, 26-29 June 2000"
"Characterization and metrology for ULSI technology 2000 : international conference, Gaithersburg, Maryland, 26 - 29 June 2000"
"Characterization and metrology for ULSI technology 2000 International Conference, Gaithersburg, Maryland, 26-29, June 2000"@en
"Characterization and metrology for ULSI technology 2000 : International Conference, Gaithersburg, Maryland, 26-29, June 2000"
"Characterization and metrology for ULSI technology, 2000 international conference, Gaithersburg, Maryland, 26-29 June 2000"@en

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