Surface scattering and diffraction for advanced metrology II : 9 July 2002, Seattle, Washington, USA

http://www.w3.org/1999/02/22-rdf-syntax-ns#type

http://schema.org/Book
http://schema.org/CreativeWork

http://schema.org/about

http://experiment.worldcat.org/entity/work/data/864112910#Topic/metrologie_congres
http://id.loc.gov/authorities/subjects/sh2001008470
http://id.loc.gov/authorities/subjects/sh85130725
http://id.worldcat.org/fast/1106581
http://id.worldcat.org/fast/893523
http://id.worldcat.org/fast/1139238
http://id.loc.gov/authorities/subjects/sh85118047
http://id.worldcat.org/fast/1018841
http://experiment.worldcat.org/entity/work/data/864112910#Topic/diffusion_diffractive_congres
http://experiment.worldcat.org/entity/work/data/864112910#Topic/optical_measurements_congresses
http://id.loc.gov/authorities/subjects/sh89000315
http://experiment.worldcat.org/entity/work/data/864112910#Topic/surface_roughness_measurement_congresses
http://experiment.worldcat.org/entity/work/data/864112910#Topic/metrology_congresses
http://id.loc.gov/authorities/subjects/sh85130724
http://id.loc.gov/authorities/subjects/sh2010101601
http://id.worldcat.org/fast/1046776
http://experiment.worldcat.org/entity/work/data/864112910#Topic/diffusion_physique_nucleaire_congres
http://experiment.worldcat.org/entity/work/data/864112910#Topic/mesures_optiques_congres
http://experiment.worldcat.org/entity/work/data/864112910#Topic/scattering_physics_congresses
http://experiment.worldcat.org/entity/work/data/864112910#Topic/diffractive_scattering_congresses
http://id.loc.gov/authorities/subjects/sh2008111217
http://id.loc.gov/authorities/subjects/sh2008108676
http://id.loc.gov/authorities/subjects/sh85095156
http://experiment.worldcat.org/entity/work/data/864112910#Topic/rugosimetrie_congres
http://id.worldcat.org/fast/1139235

http://schema.org/contributor

http://worldcat.org/entity/person/id/2642477483
http://experiment.worldcat.org/entity/work/data/864112910#Organization/society_of_photo_optical_instrumentation_engineers_united_states
http://id.loc.gov/authorities/names/n79134057
http://viaf.org/viaf/135371434
http://worldcat.org/entity/person/id/2640581756
http://experiment.worldcat.org/entity/work/data/864112910#Meeting/surface_scattering_and_diffraction_for_advanced_metrology_2_2002_07_09_seattle_wash
http://experiment.worldcat.org/entity/work/data/864112910#Organization/spie_digital_library
http://experiment.worldcat.org/entity/work/data/864112910#Organization/society_of_photo_optical_instrumentation_engineers

http://schema.org/genre

"Conference papers and proceedings"
"Conference papers and proceedings"@en

http://schema.org/name

"Surface scattering and diffraction for advanced metrology II : 9 July, 2002, Seattle, Washington, USA"
"Surface scattering and diffraction for advanced metrology II : 9 July 2002, Seattle, Washington, USA"@en
"Surface scattering and diffraction for advanced metrology II : 9 July 2002, Seattle, Washington, USA"
"Surface Scattering and Diffraction for Advanced Metrology II 9 July 2002, Seattle, Washington, USA"
"Surface scattering and diffraction for advanced metrology II 9 July 2002, Seattle, Washington, USA"
"Surface scattering and diffraction for advanced metrology II 9 July, 2002, Seattle, Washington, USA"
"Surface scattering and diffraction for advanced metrology II 9 July, 2002, Seattle, Washington, USA"@en

http://schema.org/workExample

http://www.worldcat.org/oclc/840378278
http://www.worldcat.org/oclc/53837178
http://www.worldcat.org/oclc/759718297
http://www.worldcat.org/oclc/841342552
http://www.worldcat.org/oclc/436975452
http://www.worldcat.org/oclc/249133990
http://www.worldcat.org/oclc/850798309
http://www.worldcat.org/oclc/51110642
http://www.worldcat.org/oclc/495476242

Surface scattering and diffraction for advanced metrology (2 2002.07.09 Seattle, Wash.)

This is a placeholder reference for a Meeting entity, related to a WorldCat Entity. Over time, these references will be replaced with persistent URIs to VIAF, FAST, WorldCat, and other Linked Data resources.

rdf:type
http://schema.org/Event
http://www.productontology.org/id/Meeting
schema:name
"Surface scattering and diffraction for advanced metrology (2 2002.07.09 Seattle, Wash.)"

http://experiment.worldcat.org/entity/work/data/864112910#Meeting/surface_scattering_and_diffraction_for_advanced_metrology_2_2002_07_09_seattle_wash

Society of Photo-Optical Instrumentation Engineers.

This is a placeholder reference for a Organization entity, related to a WorldCat Entity. Over time, these references will be replaced with persistent URIs to VIAF, FAST, WorldCat, and other Linked Data resources.

rdf:type
http://schema.org/Organization
schema:name
"Society of Photo-Optical Instrumentation Engineers."
"Society of Photo-optical Instrumentation Engineers"
"Society of photo-optical instrumentation engineers."
"Society of Photo-optical Instrumentation Engineers."

http://experiment.worldcat.org/entity/work/data/864112910#Organization/society_of_photo_optical_instrumentation_engineers

Society of Photo-optical Instrumentation Engineers (United States)

rdf:type
http://schema.org/Organization
schema:name
"Society of Photo-optical Instrumentation Engineers (United States)"

http://experiment.worldcat.org/entity/work/data/864112910#Organization/society_of_photo_optical_instrumentation_engineers_united_states

SPIE Digital Library.

rdf:type
http://schema.org/Organization
schema:name
"SPIE Digital Library."

http://experiment.worldcat.org/entity/work/data/864112910#Organization/spie_digital_library

Diffractive scattering Congresses.

This is a placeholder reference for a Topic entity, related to a WorldCat Entity. Over time, these references will be replaced with persistent URIs to VIAF, FAST, WorldCat, and other Linked Data resources.

rdf:type
http://schema.org/Topic
schema:name
"Diffractive scattering Congresses."