Design and analysis of integrator-based log-domain filter circuits
Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.
"Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted."@en
"Design and Analysis of Integrator-Based Log-Domain Filter Circuits deals with the design and analysis of log-domain filter circuits. It describes several synthesis methods that aid the designer in developing bipolar or BiCMOS filter circuits with cut-off frequencies ranging from the low kilohertz range to several hundreds of megahertz. Filter response deviations due to transistor-level nonidealities are systematically analyzed, leading to effective electronic compensation schemes. Numerous examples are provided in the text with measured experimental data from IC prototypes. Design and Analysis of Integrator-Based Log-Domain Filter Circuits is intended for engineers in research or development, as well as advanced-level engineering students. Extensive discussion on filter text metrics should also interest engineers who are responsible for testing high-performance, high-speed analog or mixed-signal products."
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Bipolar integrated circuits Design and construction.
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Circuits intégrés bipolaires Conception et construction.
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Filtres logarithmiques Conception et construction.
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Metal oksit yari iletkenleri, Tümleyici Tasarım ve konstrüksiyon.
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Metal oxide semiconductors, Complementary Design and construction.
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