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http://worldcat.org/entity/work/id/1171929277

VLSI Test Symposium (VTS 2000) 18th IEEE

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type

http://www.w3.org/1999/02/22-rdf-syntax-ns#type

http://schema.org/Book
http://schema.org/CreativeWork

about

http://schema.org/about

http://experiment.worldcat.org/entity/work/data/1171929277#Topic/integrated_circuits_very_large_scale_integration

creator

http://schema.org/creator

http://experiment.worldcat.org/entity/work/data/1171929277#Organization/ieee_computer_society_staff

name

http://schema.org/name

"VLSI Test Symposium (VTS 2000) 18th IEEE"

workExample

http://schema.org/workExample

http://www.worldcat.org/oclc/812656854

IEEE Computer Society Staff

This is a placeholder reference for a Organization entity, related to a WorldCat Entity. Over time, these references will be replaced with persistent URIs to VIAF, FAST, WorldCat, and other Linked Data resources.

rdf:type
http://schema.org/Organization
schema:name
"IEEE Computer Society Staff"

http://experiment.worldcat.org/entity/work/data/1171929277#Organization/ieee_computer_society_staff

Integrated Circuits Very Large Scale Integration

This is a placeholder reference for a Topic entity, related to a WorldCat Entity. Over time, these references will be replaced with persistent URIs to VIAF, FAST, WorldCat, and other Linked Data resources.

rdf:type
http://schema.org/Topic
schema:name
"Integrated Circuits Very Large Scale Integration"

http://experiment.worldcat.org/entity/work/data/1171929277#Topic/integrated_circuits_very_large_scale_integration

This information is contained in the WorldCat Entities dataset, which is made available under the ODC Attribution license.