Linked Data Explorerhttp://worldcat.org/entity/work/id/323242539
Electron beam ion sources and traps and their applications 8th international symposium, EBIS/T 2000, Upton, New York, 5-8 November 2000
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http://schema.org/about
- http://experiment.worldcat.org/entity/work/data/323242539#Topic/faisceaux_electroniques_congres
- http://id.loc.gov/authorities/subjects/sh85042200
- http://experiment.worldcat.org/entity/work/data/323242539#Topic/sources_d_ions_congres
- http://id.loc.gov/authorities/subjects/sh2008119291
- http://id.worldcat.org/fast/906654
- http://id.worldcat.org/fast/978602
- http://id.loc.gov/authorities/subjects/sh85067808
http://schema.org/genre
- "Conference papers and proceedings"
- "Conference papers and proceedings"@en
http://schema.org/name
- "Electron beam ion sources and traps and their applications : 8th international symposium, EBIS/T 2000, Upton, New York, 5-8 November 2000"
- "Electron Beam Ion Sources and Traps and their Applications, 8th International Symposium, EBIS"
- "Electron beam ion sources and traps and their applications 8th international symposium, EBIS/T 2000, Upton, New York, 5-8 November 2000"@en