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http://worldcat.org/entity/work/id/5071593
IMTC '85 proceedings
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type
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://schema.org/CreativeWork
about
http://schema.org/about
http://id.worldcat.org/fast/907353
http://id.loc.gov/authorities/subjects/sh2008119318
alternateName
http://schema.org/alternateName
"
Proceedings IMTC '85
"
"
IEEE 1985 Instrumentation and Measurement Technology Conference
"
"
IEEE Instrumentation and Measurement Technology Conference
"
contributor
http://schema.org/contributor
http://viaf.org/viaf/123926298
http://viaf.org/viaf/136110346
http://id.loc.gov/authorities/names/n85194339
http://id.loc.gov/authorities/names/n79053217
http://viaf.org/viaf/137131892
http://id.loc.gov/authorities/names/n82086664
creator
http://schema.org/creator
http://experiment.worldcat.org/entity/work/data/5071593#Meeting/ieee_instrumentation_and_measurement_technology_conference_2nd_1985_tampa_fla
genre
http://schema.org/genre
"
Conference papers and proceedings
"
name
http://schema.org/name
"
IMTC '85 proceedings
"
workExample
http://schema.org/workExample
http://www.worldcat.org/oclc/12613753
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IEEE Instrumentation and Measurement Technology Conference (2nd : 1985 : Tampa, Fla.)
This is a placeholder reference for a
Meeting
entity, related to a WorldCat
Entity
. Over time, these references will be replaced with persistent URIs to VIAF, FAST, WorldCat, and other Linked Data resources.
rdf:type
http://schema.org/Event
http://www.productontology.org/id/Meeting
schema:name
"
IEEE Instrumentation and Measurement Technology Conference (2nd : 1985 : Tampa, Fla.)
"
http://experiment.worldcat.org/entity/work/data/5071593#Meeting/ieee_instrumentation_and_measurement_technology_conference_2nd_1985_tampa_fla