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Two- and three-dimensional vision systems for inspection, control, and metrology II : 26-27 October, 2004, Philadelphia, Pennsylvania, USA
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- http://id.loc.gov/authorities/subjects/sh85029549
- http://id.worldcat.org/fast/1084993
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- http://id.loc.gov/authorities/subjects/sh2001008470
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- http://experiment.worldcat.org/entity/work/data/993391136#Topic/imagerie_technique_congres
- http://id.worldcat.org/fast/1084966
- http://experiment.worldcat.org/entity/work/data/993391136#Topic/optical_pattern_recognition_systems
- http://experiment.worldcat.org/entity/work/data/993391136#Topic/optical_pattern_recognition_systems_congresses
- http://experiment.worldcat.org/entity/work/data/993391136#Topic/affichage_tridimensionnel_congres
- http://id.loc.gov/authorities/subjects/sh85135021
- http://id.loc.gov/authorities/subjects/sh2008101162
- http://experiment.worldcat.org/entity/work/data/993391136#Topic/qualite_controle_methodes_optiques_congres
- http://experiment.worldcat.org/entity/work/data/993391136#Topic/metrologie_congres
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http://schema.org/contributor
- http://experiment.worldcat.org/entity/work/data/993391136#Meeting/conference_2004_10_26_27_philadelphia_pa
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- http://experiment.worldcat.org/entity/work/data/993391136#Organization/denshi_jh_tsshin_gakkai_japan_erekutoronikusu_sosaieti
- http://worldcat.org/entity/person/id/2638190837
- http://id.loc.gov/authorities/names/no99049038
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- http://viaf.org/viaf/139287016
- http://experiment.worldcat.org/entity/work/data/993391136#Organization/spie_digital_library
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- http://id.loc.gov/authorities/names/no00030606
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http://schema.org/genre
- "Conference papers and proceedings"
- "Conference papers and proceedings"@en
http://schema.org/name
- "Two- and three-dimensional vision systems for inspection, control, and metrology II : 26-27 October, 2004, Philadelphia, Pennsylvania, USA"
- "Two- and three-dimensional vision systems for inspection, control, and metrology II : 26-27 October, 2004, Philadelphia, Pennsylvania, USA"@en
- "Two- and three-dimensional vision systems for inspection, control, and metrology II 26-27 October, 2004, Philadelphia, Pennsylvania, USA"@en
- "Two- and three-dimensional vision systems for inspection, control, and metrology II 26-27 October, 2004, Philadelphia, Pennsylvania, USA"
- "Two- and three-dimensional vision systems for inspection, control, and metrology II : 26-27 October 2004, Philadelphia, Pennsylvania, USA"
- "Two- and three-dimensional vision systems for inspection, control, and metrology II : 26 - 27 October 2004, Philadelphia, Pennsylvania, USA"
- "Two- and three-dimensional vision sysems for inspection, control, and metrology II 26-27 October 2004, Philadelphia, Pennsylvania, USA"
http://schema.org/workExample
- http://www.worldcat.org/oclc/57563958
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