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http://worldcat.org/entity/work/id/3867074
Integrated circuit metrology II May 3-4, 1984, Arlington, Virginia
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http://schema.org/Book
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about
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http://id.worldcat.org/fast/975535
http://id.worldcat.org/fast/1715944
http://id.loc.gov/authorities/subjects/sh2008104261
http://id.loc.gov/authorities/subjects/sh2008107149
contributor
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http://viaf.org/viaf/126653902
http://experiment.worldcat.org/entity/work/data/3867074#Meeting/integrated_circuit_metrology_2_1984_05_03_04_arlington_va
http://worldcat.org/entity/person/id/2677759180
http://id.loc.gov/authorities/names/n79021148
http://worldcat.org/entity/person/id/2675951280
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Conference papers and proceedings
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Integrated circuit metrology II May 3-4, 1984, Arlington, Virginia
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Integrated Circuit Metrology II : May 3-4, 1984, Arlington, Virginia
"
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Integrated circuit metrology II : May 3-4, 1984, Arlington, Virginia
"
workExample
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http://www.worldcat.org/oclc/11463239
http://www.worldcat.org/oclc/257929962
http://www.worldcat.org/oclc/809933789
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Integrated Circuit Metrology (2 1984.05.03-04 Arlington, Va.)
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Integrated Circuit Metrology (2 1984.05.03-04 Arlington, Va.)
"
http://experiment.worldcat.org/entity/work/data/3867074#Meeting/integrated_circuit_metrology_2_1984_05_03_04_arlington_va